ULTRA-HIGH THROUGHPUT
Best COT for Automotive devices
High parallel test MEMS solution
48 x site Si, SiC and GaN ATE solution
Compact, mixed signal ATE for lab and engineering
Better ROI enabled via ovenless burn-in technology
MORE THAN 1500 ATE SOLD WORLDWIDE
BY 2024
The world’s first solution for Automatic Test Program Generation
A process to ensure reliability, performance, and compliance with specifications.
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