Hatina platform is able to drive and produce different stimuli, and perform devices testing, both at wafer level and final test.
Hatina 4S can be adapted to all major handlers, where stimuli are already available.
Low footprint solution to drive M&MEMS kit. To test Accelerometer and Gyroscope at final test.
Hatina 4S can fulfill test requirements for MEMS Humidity, Pressure and Temperature sensor at final Test.
- Direct installation on the tilt and twist unit
- 32 sites parallel testing
- 64 PPMU + 320 Digital Channels
- DSP Embedded
- Automotive range (-40 +180 °C)
- Dynamic Temperature Conditioning
- 32 sites running production
- Possibility to manage higher parallelism: 35/70/140… Also, in ping pong
- Higher throughput