Hatina 4S
ATE di nuova generazione per il test di dispositivi mems
Aumenta il production throughput e riduce i costi grazie all’utilizzo di un’unica scheda di interfaccia.
La piattaforma Hatina è in grado di fornire differenti stimoli ed eseguire il test dei dispositivi, sia al “wafer level” che al “final Test”.
Hatina 4S si adatta ai principali handler, dove gli stimoli sono già disponibili.
Different configurations for different types of test
Applicazioni
Magnetic Sensor Testing Solution
Main Features
- Up to 400 Gauss
- 35/70 sites in parallel
- Single reference per site
- Patented coil less solution
- 3D rotating magnetic field
MEMS SOLUTIONS MICROPHONE
Microtest’s complete solution to test MEMS Microphones
including stimuli & devices handling.
Microtest, in partnership with major handler makers, is able to provide complete test solution for any kind of MEMS device
Main Features
- SNR up to 75dB
- Max SPL up to 140dB
- Less than 20dB SPL noise floor
- Accuracy of SPL < 0.1dB
- THD < 0.1%
- Up to 70 sites parallelism
- Test frequency from 20Hz to 20kHz
MEMS SOLUTIONS HUMIDITY CHAMBER/HUMIDITY SENSOR
Hatina 4S can fulfill test requirements for MEMS Humidity, Pressure and Temperature sensor at final Test.
Main Features
- Automotive range (-40 +180 °C)
- Dynamic Temperature Conditioning
- Less than 20dB SPL noise floor
- 32 sites running production
- Possibility to manage higher parallelism: 35/70/140… Also, in ping pong
- Higher throughput
MEMS SOLUTIONS ACCELEROMETER & GYROSCOPE
Low footprint solution to drive M&MEMS kit. To test Accelerometer and Gyroscope at final test.
Main Features
- Direct installation on the tilt and twist unit
- 32 sites parallel testing
- 64 PPMU + 320 Digital Channels
- DSP Embedded