Very compact solution for MEMS device testing.

Increase production throughput and reduce costs because it allows the qualification of different types of devices without changing interface board.

Hatina platform is able to drive and produce different stimuli, and perform devices testing, both at wafer level and final test.
Hatina 4S can be adapted to all major handlers, where stimuli are already available.

Low footprint solution to drive M&MEMS kit. To test Accelerometer and Gyroscope at final test.


Hatina 4S can fulfill test requirements for MEMS Humidity, Pressure and Temperature sensor at final Test.

Different configurations for different types of test

• Magnetic field generator/Magnetometer
• Microspeakers/Microphone
• Temperature conditioning/Temperature sensor
• Pressure Chamber/Pressure sensor
• Humidity Chamber/Humidity sensor
• Twist & Tilt unit/Accelerometer & Gyroscope