ATE configurable for low-voltage silicon power products
Automatic Test Equipment configurable for low-voltage silicon power products; high-side and low-side Driver ICs, IGBT, Power MOSFETs, Power ICs.
Reasons Why
Product Presentation
VIP Extended is a highly configurable ATE system designed for parallel testing of silicon-based, SiC, and GaN devices, including high-side/low-side drivers, IGBTs, power MOSFETs, and power ICs.
Engineered for use in wafer sort, strip test, Pick & Place, and Gravity handler environments, the system supports up to 48 parallel test sites for parameters such as Rg, Cg, and UIS, ensuring high device throughput (UPH) and reduced test costs.
The system includes up to 48 four-quadrant DC resources (±80 V, ±4 A), 48 programmable current sink/source channels up to ±250 A, 320 digital channels with variable levels from –1.25 V to 6.75 V, 64 M pattern memory per channel, and up to 192 floating digital drivers.
Timing measurements are handled by a 48-channel TMU, alongside up to 48 LCR meters, 64 PPMUs, 48 picoammeters (with 20 pA accuracy), and 64 inductive/resistive loads.
All components are housed in a compact cabinet (350 × 600 × 640 mm), making VIP Extended ideal for integration into production lines.
VIP Extended is designed to provide modularity across multiple test configurations, adapting to specific device requirements while reducing cost per test through resource density and operational flexibility.
It supports applications across automotive, consumer, industrial, aerospace, and MEMS sectors, integrating seamlessly into high-volume production environments.
In summary, VIP Extended combines high-performance parallel testing, extensive resource configurability, precision, and compact design, delivering an effective solution for advanced power device testing in markets that demand high productivity, flexibility, and cost-efficiency.
VIP Extended
Dimensions
Analog/Power
Digital
Up to 64 PPMU
Measurements Instruments
Current Range from 2nA to 2uA (up to ±20pA accuracy)
Applications
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