VIP Extended
ATE CONFIGURABLE FOR Si, SiC AND GaN POWER PRODUCTS
Gallery
Automatic Test Equipment configurable for Si, SiC and GaN power products; High side and low side Driver ICs, IGBT, Power MOSFETs, Power ICs.
Highlights:
- High UPH for wafer sort and strip test
- 48 x site parallel test for Rg, Cg and UiS
- Lowest COT for power products
Key Features:
- DC [4 quadrants Ground Referred] Sources Medium Power: up to 64 resources [±110V, ±4A]
- DC Programmable Sink/Source Current: up to 64 resources [up to ±250A]
- Digital Channels: up to 320 channels [-1,25V to 6,75V output level, 50mA, active Load ±12mA, 64M Pattern Memory/ch, 32M DSIO Memory/ch, one PPMU per channel]
- Time Measurement Unit up to 64
- Floating Digital Driver up to 192
- LCR Meters: up to 64
- PPMU: up to 64
- Pico Meters: up to 64 [20pA as accuracy]
- Inductive & Resistive Loads up to 64 x2
Dimensions
Height:
350 mm
Width:
600 mm
Depth:
640 mm
ATE
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