Quasar200
and Pulsar600
Everything you need for fast measurements on SiC, GaN, Si devices and bare die
Wide bandgap (WBG) power devices such as SiC and GaN require a completely different approach to characterization than the previous generation of Si power products. Higher powers, significantly faster switching speeds and a wide range of necessary performance standards such as JESD 24-9, JESD 24-10 and AQG-324, all place new demands on the power analyser.
The Quasar200 and Pulsar600 Power Characterization Testers make it quick and easy to measure WBG power device performance.
Quasar200 is ideal for Si, GaN and lower power SiC testing. Pulsar600 is our ultimate characterization solution for ultra high current applications, particularly SiC, invertor and automative applications.
ipTEST are famous for testing the latest WBG devices at production speeds. Now enjoy the benefits in your characterization lab.
Reasons Why
Turnkey Solution
Accuracy
Safety
Product Presentation
Complete solution for Wide Bandgap device testing
ipTEST lab systems are built to accelerate how engineers characterize power devices—whether in research, development, or pre-production.
From initial setup to high-voltage test execution and result reporting, our platform is comprehensive, precise, and safe. With modular hardware, intuitive software, and UKAS-traceable calibration, ipTEST gives labs the ability to generate real, actionable insight—faster and with fewer variables.
Accuracy
At the heart of every ipTEST lab system is a commitment to absolute measurement accuracy.
High-bandwidth instrumentation and precision timing control, our platform captures real device behavior down to the nano range—enabling credible, reproducible data you can trust.
Whether you’re analyzing subtle switching transients or performing DC characterization, our systems deliver verified ±0.1% accuracy across voltage and current waveforms, with industry-leading <30 nH parasitics on AC testing.
Robust: built-in auto-calibration and real-time system monitoring ensure your test conditions remain precise and traceable throughout the measurement workflow.
Calibration logs are automatically generated, providing a full audit trail and reinforcing data integrity in high-stakes environments like qualification, compliance, or academic research.
Reproducibility: our systems are engineered for system-to- system consistency, ensuring what you measure in development is what you’ll see in volume manufacture, for fast release of new product to production.
Safety
When working with high voltages and fast-switching devices, safety is crucial and is engineered into every part of our products.
Our systems feature a fully enclosed test environment with monitored hardware interlock access, allowing users to perform high-voltage and high-current tests without risk of exposure to live terminals.
Socket Safe: safeguard your investment. Testing and measuring at high power levels places significant demands on both the device under test (DUT) and the test and measurement hardware. Whether performing destructive tests or measuring fragile devices, ipTEST power characterization testers are well protected should the DUT fail catastrophically. ipTEST’s SocketSafeTM technology safeguards the test socket and test hardware should the DUT develop a fault. Energy is swiftly removed from the device and tester, minimizing the need for test socket repairs, saving on maintenance costs and maximising uptime. Particularly crucial when testing unpackaged bare die.
Compliance: whether in an academic lab or production facility, this ensures peace of mind and compliance with the strictest safety protocols. Every system is CE-marked and designed in accordance with key SEMI standards alongside UKAS certified calibration.
Quasar200
Pulsar600
AC Source
AC Measure
1,000 A option
3,000A and 12,000A options
AC Misc.
DC Source
DC Measure
System
Gallery
More info
This App allows you to visualize some 3D models of Microtest ATE in Augmented Reality.
