Hatina GP
THE GENERAL PURPOSE ATE FOR ASIC, PMIC and Smart Power
empowered by:
Kronos is a Software Toolset, which generates better and faster Test Programs, through automatic translation of test descriptions to code
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The HATINA GP is designed for testing complex Smart Power ICs and SoC. Recommended for high parallelism.
Highlights:
- Integrated multiplexer reduces load board complexity
- >99% parallel test efficiency provides best in class COT
- Modular instrumentation aligns to market and technology needs
- A smaller footprint and less power improve ROI
- Automated test program development improves time to market
- Revolutionary SW tools (Kronos)
Key Features:
- DC [IV quadrants Ground Referred] Sources Low Power: up to 160 resources per slot [±110V, ±200mA]
- DC [IV quadrants Ground Referred] Sources Medium Power: up to 80 resources per slot [±110V, ±4A]
- DC [IV quadrants Fully Floating] Sources High Power: up to 16 resources per slot [±80V, ±10A]
- Digital Channels: up to 256 channels per slot [-1,25V to 6,75V output level, 50mA, active Load ±12mA]
- Digital Channel LF II°Gen @200MHz up to 1024
- DPS HC [Digital Power Supply – High Current] 5.5V@10A up to 80
- DPS LC [Digital Power Supply – Low Current] 7V@1A up to 256
- Digital Channel HF @800MHz up to 256
- Time Measurement Unit & Differential Meter, AWG & Digitizer
- OPTION: -HV option
- Time Measurement Unit up to 64
- Floating Digital Driver up to 192
- LCR Meters: up to 64
- PPMU: up to 64
- Pico Meters: up to 64 [20pA as accuracy]
- Inductive & Resistive Loads up to 64 x 2
Dimensions
Height:
700 mm
Width:
670 mm
Depth:
640 mm
ATE
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