Vip Ultra
New-gen, high-throughput ATE configurable for complex smart power devices, SiC, and GaN power discrete products
Gallery
New-gen Automatic Test Equipment configurable for Si, SiC and GaN power products; high side and low side Driver ICs, IGBT, Power MOSFETs, Power ICs.
Configurations:
VIP Ultra STD 80V
- 250A (48 sites)
VIP Ultra HV 1.7kV
- 250A (32 sites)
VIP Ultra HV 4kV
- 250A (16 sites)
Highlights:
- Lowest TCO for power products
- Double throughput
- Minimum footprint
- The definitive platform for the entire range of power applications
- Wafers testing
- Power Discrete
- Power Modules
- Smart Power devices
- High side and low side Driver ICs
Key Features:
- DCS sources [4 quadrants Ground Referred]: up to 48 resources [±80V, ±4A]
- DC Programmable Load Sink/Source: up to 48 resources [up to ±250A]
- Digital Channels: 320 resources [0V to 5,5V output level, 50mA, DSIO Memory/ch, one PPMU per channel]
- Time Measurement Unit: up to 48
- Differential Voltage Meters: up to 48
- Floating Digital Driver: up to 192
- LCR Meters: up to 48
- PPMU: 64
- Pico Meters: up to 48 [20pA as accuracy]
- Inductive & Resistive Loads
Dimensions
Height:
647 mm
Width:
638 mm
Depth:
702 mm
ATE
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