M2 Turret Edition

Next generation power products, particularly wide bandgap (WBG) require more testing while production process parameters and product yield are optimized. M2 Turret Edition measures static parameters, dynamic switch performance, thermal die attach, gate quality, and stress tests such as avalanche and short circuit, using high performance modular test generators.

Throughput: highest UPH (units tested per hour) means best test cell utilization, improved production output, and reduced cost of test for a faster return on investment.
ipTEST’s M2 platform features ultra fast test generators and software designed and optimized for highest speed electrical test.
Index parallel approach for testing on turret maximises throughput by splitting the test plan over multiple test generators, each performing very short tests in parallel.

Test with Confidence: testing power devices places significant demands on the tester hardware. ipTEST’s M2 platform is rugged and accurate, engineered for 24/7 operation in high volume production environments, ensuring high reliability and long time intervals between interventions. This increases test cell output and minimizes the demands on operators and maintenance teams.

Productivity: invest in the features you need today and add new capabilities later when your products evolve for quick return on investment.
M2 is a highly modular and expandable platform which can be reconfigured with new test hardware as your needs evolve.

M2 Turret Edition is the perfect platform for high throughput testing of modern power devices, including MOSFETs, JFETs, IGBTs, transistors, silicon controlled rectifiers, bipolar devices, diodes, TRIACs and intelligent power devices.