Hatina WLBI
Solution for wafer level Burn-In for power MOS
Highlights:
- WLBI for power technologies – Si, SiC, GaN
- Compatible with 6-, 8- and 12-inch wafers
- Capable of full wafer burn in
- Cost Effective Solution for reliability and lifecycle testing
- Leverages standard wafer prober technology
Key Features:
- Parallelism: 160 sites to 1600 sites
- Voltage: up to 1.2KV per site
- Current: 2mA per site
- Test setup:
- Functional Test
- HTGB
- HTRB
Dimensions
Height:
550 mm
Width:
560 mm
Depth:
560 mm
ATE
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