January 2008 : New Prober F200 available
  January 2008 :  New Prober F200 available  [...]
  April 2008 : New Teradyne Microflex ATE with RF Option installed in Microtest
  April 2008 :  New Teradyne Microflex ATE  [...]
  October 2008: SEMICON 2008
  Visit our stand at SEMICON 2008 (Stuttgart) from  [...]
  July 2009:
  MSW03, MSW05 and MSW06 datasheets on website  [...]
HOMEHome OLT SOLUTIONSHome
We develop in house an OLT / Burn In- System able to put in the ovens just the devices under test.

It’s possible to put outside the ovens, but very close to the device,
all the needed standard components and to monitor 16 digital points
and 16 analog points for each device.

We are using this equipment to test several kinds of components
and we are able to follow the microelectronic qualification flow completely.